Residual Stress Measurement in Si-based Multilayer Structure by Micro-Raman Spectroscopy
نویسندگان
چکیده
منابع مشابه
Silica (agate-jasper) mineralization in the Chah Andoo plain, SW Damqan by Micro-Raman spectroscopy
The Chah Andoo plain is located about 100 km SW Damqan in Semnan Province. Basalt, andesite-basalt, tuff and metamorphic rocks are the main rocks which exposed in the study area. Agate, jasper and agate–jasper are silica minerals widespread at the plain surface as crushed fragments from a few millimeters to 0.5 meter in dimension. Banded (mono centric), stalactite (landscape), mossy and thunder...
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Department of Geological Sciences, Stanford University, Stanford, CA 94305, USA Center for High Pressure Science and Technology Advanced Research (HPSTAR), Shanghai 201203, PR China HPSynC, Geophysical Laboratory, Carnegie Institution of Washington, Argonne, IL 60439, USA Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, USA Photon Science and Stanford In...
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Laser micro-Raman spectroscopy is an ideal tool for assessment and characterization of various types of carbon-based materials. Due to its special optical properties (CrN) coated stainless steel substrates. NCD films have been investigated by laser micro-Raman spectroscopy. The fingerprint of diamond based materials is in the spectral region of 1000-1600 cm-1 in the first order of Raman scatter...
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Residual stress in the surface of dental porcelain was estimated using laser Raman spectroscopy. Sixteen different magnitudes of residual stress were generated in commercial porcelain disks by tempering, ion exchange, and slow cooling. The specimens were analyzed using a laser-Raman spectrometer with an Ar+ laser. The Raman shift of the largest peak near 500 cm-1 originating from silica was use...
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ژورنال
عنوان ژورنال: Optics
سال: 2015
ISSN: 2328-7780
DOI: 10.11648/j.optics.s.2015040301.18